Essentials of Electronic Testing for Digital, Memory and Mixed Signal VLSI Circuits (Frontiers in Testing, Band 17)

Thermal Aware Testing of Digital VLSI Circuits and Systems

Springer

Introduction to IDDQ Testing (Frontiers in Electronic Testing, Band 8)

Springer

Soft Errors in Modern Electronic Systems (Frontiers Testing, 41, Band 41)

Wiley

Black Box Testing: Techniques for Functional Testing of Software and Systems