SEMICONDUCTOR PROCESS VARIATION and Design ROBUSTNESS: Statistical Modeling Yield Prediction Tolerance Driven

Preise von
13,11

Hervorgehoben

ALLE WEBSHOPS VERGLEICHEN (2)

Beschreibung

Amazon SEMICONDUCTOR PROCESS VARIATION AND DESIGN ROBUSTNESS: Statistical Modeling Yield Prediction and Tolerance Driven Design
Description Beschreibung
Product Specifications Produktspezifikationen
Verwandte Ergebnisse Verwandte Ergebnisse
Next
Previous

Webshops vergleichen (2)

Shop
Preis
Versandkosten
Total price
Amazon Logo
13,11 €
Gratis
13,11 €
Zum Shop
Gratis Shipping Costs
Amazon Marketplace Logo
13,11 €
Gratis
13,11 €
Zum Shop
Gratis Shipping Costs
Beschreibung (1)

SEMICONDUCTOR PROCESS VARIATION AND DESIGN ROBUSTNESS: Statistical Modeling Yield Prediction and Tolerance Driven Design

Produktspezifikationen

Marken Independently Published
EAN
  • 9798252208749

Wiley

Process Dynamics and Control: Modeling for Control Prediction

128,70 €
Weitere Informationen Mehr Infos

Shaker Verlag

Grassland yield prediction: Development and evaluation of sensor systems modeling approaches

59,80 €
Weitere Informationen Mehr Infos

Princeton University Press

Hybrid Dynamical Systems: Modeling, Stability, and Robustness

91,09 €
Weitere Informationen Mehr Infos

Independently Published

SEMICONDUCTOR MANUFACTURING PROCESS CONTROL: Lithography Yield Enhancement Defect Analysis and Fabrication Optimization

11,75 €
2 Shops vergleichen 2 Shops
Hervorgehobene Wahl
13,11 €
Zum Shop