Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Preise von
66,52

Hervorgehoben

ALLE WEBSHOPS VERGLEICHEN (2)

Beschreibung

Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Description Beschreibung
Product Specifications Produktspezifikationen
Verwandte Ergebnisse Verwandte Ergebnisse
Next
Previous

Webshops vergleichen (2)

Shop
Preis
Versandkosten
Total price
Amazon Logo
66,52 €
Gratis
66,52 €
Zum Shop
Gratis Shipping Costs
Amazon Marketplace Logo
66,52 €
Gratis
66,52 €
Zum Shop
Gratis Shipping Costs
Beschreibung (0)

Superlattice and Strained Layers of Compound Semiconductors: Analytical Method Characterization

Produktspezifikationen

Marken LAP LAMBERT Academic Publishing
EAN
  • 9786630234442

Suresh Jain (u. a.) Compound Semiconductors Strained Layers and Devices Buch

141,95 €
Weitere Informationen Mehr Infos

LAP LAMBERT Academic Publishing

Epitaxy of compound semiconductors and irradiation technology Selvakumar Sudhaka

68,00 €
Weitere Informationen Mehr Infos

Routledge

Analytical Method Development and Validation

55,89 €
2 Shops vergleichen 2 Shops

Noor Publishing

Sara Jwad Kadhim Preparation and Characterization of Schiff Base Compound

19,79 €
Weitere Informationen Mehr Infos
Hervorgehobene Wahl
66,52 €
Zum Shop