SUBMICRON DEVICE SCALING and VARIABILITY ENGINEERING: Process Induced Dispersion Statistical Modeling Performance Predictability

SEMICONDUCTOR PROCESS VARIATION and Design ROBUSTNESS: Statistical Modeling Yield Prediction Tolerance Driven

SEMICONDUCTOR FABRICATION YIELD ENGINEERING: Process Control Statistical Methods and Defect Density Reduction

Heavy Tail Phenomena: Probabilistic and Statistical Modeling (Springer Series in Operations Research Financial Engineering)